Elster E.

Institute of Electrical and Optical Communications Engineering University of Stuttgart Stuttgart, Germany


IS01–Improved Phase Detection in On-Chip Refractometers

Schweikert C., Hoppe N., Elster E., Vogel W., Berroth M.

An improved phase detection scheme for Mach-Zehnder and bimodal interferometers is presented. By using a 90° hybrid, always two outputs operate at a highly sensitive point and the phase-shift-unambiguousness is extended to a range of 2π. The phase detection is independent of mode attenuations and input power fluctuations.