Gothoskar P.

Cisco Systems, 7540 Windsor Drive, Suite 412, Allentown, PA 18195, USA

Presentations

D04–Ge-on-Si waveguide photodetectors: multiphysics modeling and experimental validation

Alasio M. G. C., Goano M., Tibaldi A., Bertazzi F., Namnabat S., Adams D., Gothoskar P., Forghieri F., Ghione G., Vallone M.

This work compares a multiphysics modeling approach with experimental measurements of two Ge-on-Si butt-coupled waveguide photodetectors. The coupled three dimensional electromagnetic and electrical simulation of the frequency response shows promising agreement with the measurements at 1310 nm, and provides detailed information about significant microscopic quantities, such as the spatial distribution of the optical generation rate.